Top view of the DarkLight @ ARIEL experimental layout on the ARIEL beamline just upstream of the beamdump.

Detailed view of the DarkLight experimental apparatus

Sensitivity plot of DarkLight experiment with 30 and 50 MeV electron beam looking for 13 and 17 MeV dark matter candidate.

Cut-away view of a spectrometer vacuum chamber showing the particle trajectories for the events of interest and the PEEK absorber designed to reduce the background caused by elastic (i.e. higher momentum particles) from striking the back wall of the vacuum chamber and producing background in the GEM detectors.